EarthRef.org Reference Database (ERR) -- Hecht et al. 2008

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Hecht et al. 2008

Hecht, M.H., Marshall, J., Pike, W.T., Staufer, U., Blaney, D., Braendlin, D., Gautsch, S., Goetz, W., Hidber, H.-R., Keller, H.U., Markiewicz, W.J., Mazer, A., Meloy, T.P., Morookian, J.M., Mogensen, C., Parrat, D., Smith, P., Sykulska, H., Tanner, R.J., Reynolds, R.O., Tonin, A., Vijendran, S., Weilert, M. and Woida, P.M. (2008). Microscopy capabilities of the Microscopy, Electrochemistry, and Conductivity Analyzer. Journal of Geophysical Research 113: doi: 10.1029/2008JE003077. issn: 0148-0227.

Keywords
Planetary Sciences, Solid Surface Planets, Instruments and techniques, Planetary Sciences, Solid Surface Planets, Surface materials and properties, Planetary Sciences, Solid Surface Planets, Polar regions

Journal
Journal of Geophysical Research
http://www.agu.org/journals/jb/

Publisher
American Geophysical Union
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