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Detailed Reference Information |
Krinsley, D. (1988). Advanced Scanning Electron Microscopy and X Ray Microanalysis. Eos, Transactions American Geophysical Union 69: doi: 10.1029/88EO01092. issn: 0096-3941. |
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Keywords
Mineralogy, Petrology, and Rock Chemistry, Instruments and techniques, General or Miscellaneous, Techniques applicable in three or more fields, General or Miscellaneous, Instruments useful in three or more fields, Physical Properties of Rocks, Instruments and techniques |
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Journal
Eos, Transactions American Geophysical Union |
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Publisher
American Geophysical Union 2000 Florida Avenue N.W. Washington, D.C. 20009-1277 USA 1-202-462-6900 1-202-328-0566 service@agu.org |
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