EarthRef.org Reference Database (ERR) -- Albee 1982

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Albee 1982

Albee, A.L. (1982). Scanning Electron Microscopy and X-Ray Microanalysis. Eos, Transactions American Geophysical Union 63: doi: 10.1029/EO063i047p01188. issn: 0096-3941.

Keywords
General or Miscellaneous, Instruments useful in three or more fields, Planetology, Instruments and techniques, Mineralogy, Petrology, and Crystal Chemistry, Instruments and techniques

Journal
Eos, Transactions American Geophysical Union

Publisher
American Geophysical Union
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