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Kim et al. 2012

Kim, T.W., Tokunaga, T.K., Shuman, D.B., Sutton, S.R., Newville, M. and Lanzirotti, A. (2012). Thickness measurements of nanoscale brine films on silica surfaces under geologic CO₂ sequestration conditions using synchrotron X-ray fluorescence. Water Resources Research 48: doi: 10.1029/2012WR012200. issn: 0043-1397.

Keywords
Hydrology, Groundwater hydrology, Hydrology, Groundwater transport

Journal
Water Resources Research
http://www.agu.org/wrr/

Publisher
American Geophysical Union
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