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Mukerji et al. 1998
Mukerji, T., Jørstad, A., Mavko, G. and Granli, J.R. (1998). Near and far offset impedances: Seismic attributes for identifying lithofacies and pore fluids. Geophysical Research Letters 25: doi: 10.1029/1998GL900187. issn: 0094-8276.

Reliably predicting lithologic and saturation heterogeneities is a key problem in reservoir characterization. This study shows how near and far offset seismic impedance can be used to classify lithologies and pore fluids. The near offset seismic stack approximates a zero offset section, giving an estimate of the normal incidence acoustic impedance (AI=&rgr;V). The far offset stack gives an estimate of a VP/VS related elastic impedance (EI) attribute, equivalent to the acoustic impedance for non-normal incidence. These attributes can be computed from log data. Well data can be used, prior to seismic inversions, to test the feasibility of using AI-EI attributes for lithofacies identification. Bi-variate AI-EI probability distribution functions can be estimated from logs to obtain classification success rate for each facies. Success rate is a measure of the value of far-offset data for reservoir characterization. Examples are presented from North Sea, Gulf of Mexico, and Australia. ¿ 1998 American Geophysical Union

BACKGROUND DATA FILES

Abstract

Keywords
Physical Properties of Rocks, Acoustic properties, Exploration Geophysics, Seismic methods, Exploration Geophysics, General or miscellaneous, Physical Properties of Rocks
Journal
Geophysical Research Letters
http://www.agu.org/journals/gl/
Publisher
American Geophysical Union
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