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Detailed Reference Information |
Mukerji, T., Jørstad, A., Mavko, G. and Granli, J.R. (1998). Near and far offset impedances: Seismic attributes for identifying lithofacies and pore fluids. Geophysical Research Letters 25: doi: 10.1029/1998GL900187. issn: 0094-8276. |
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Reliably predicting lithologic and saturation heterogeneities is a key problem in reservoir characterization. This study shows how near and far offset seismic impedance can be used to classify lithologies and pore fluids. The near offset seismic stack approximates a zero offset section, giving an estimate of the normal incidence acoustic impedance (AI=&rgr;V). The far offset stack gives an estimate of a VP/VS related elastic impedance (EI) attribute, equivalent to the acoustic impedance for non-normal incidence. These attributes can be computed from log data. Well data can be used, prior to seismic inversions, to test the feasibility of using AI-EI attributes for lithofacies identification. Bi-variate AI-EI probability distribution functions can be estimated from logs to obtain classification success rate for each facies. Success rate is a measure of the value of far-offset data for reservoir characterization. Examples are presented from North Sea, Gulf of Mexico, and Australia. ¿ 1998 American Geophysical Union |
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Abstract |
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Keywords
Physical Properties of Rocks, Acoustic properties, Exploration Geophysics, Seismic methods, Exploration Geophysics, General or miscellaneous, Physical Properties of Rocks |
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Publisher
American Geophysical Union 2000 Florida Avenue N.W. Washington, D.C. 20009-1277 USA 1-202-462-6900 1-202-328-0566 service@agu.org |
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