The coincidence ionization experiment used previously to measure ionization-excitation branching ratios for the X 2&Sgr;g +, A 2&Pgr;u, and B 2&Sgr;u + states of N2 + at a fixed secondary electron emission angle of 74¿ has been modified to allow the secondary emission angle to be scanned. Angular distributions of electrons which have excited the three available electronic states of the N2 + ion have been measured at 100 eV. For the small, primary electron scattering angles where most ionization events occur the distribution for the X 2&Sgr;g + state is found to have a peak at 57¿ with respect to the incident beam direction, while that for the A 2&Pgr;u state has a broad peak near 75¿. The distribution for the much less intense B 2&Sgr;u + state is intermediate between the two. The partial branching ratios deduced for the 74¿ fixed angle case have been corrected to reflect the more accurate partial branching ratios obtained by integrating the secondary electron angular results. The corrected values for the X 2&Sgr;g +, A 2&Pgr;u, and B 2&Sgr;u + states are 0.56¿0.05, 0.35¿0.03, and 0.09¿0.02, respectively. These results show that the A 2&Pgr;u state branching ratio is much smaller than deduced from a number of previous studies. ¿ American Geophysical Union 1994