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Steinberger et al. 2001
Steinberger, B., Schmeling, H. and Marquart, G. (2001). Large-scale lithospheric stress field and topography induced by global mantle circulation. Earth and Planetary Science Letters 186(1): 75-91. doi: 10.1016/S0012-821X(01)00229-1.
Stresses in the lithosphere are one indication of processes in the Earth interior: here we present a calculation of large-scale lithospheric stresses caused by global mantle circulation. The mantle flow field is calculated based on density structures inferred from global seismic tomography. Predicted principal stress directions are compared to interpolations based on observed stresses. Agreement between predictions and observations is often good in regions where lithospheric stresses and mantle tomography are well constrained. Predicted magnitudes of scalar stress anomalies vary more strongly than predicted trees directions for various tomographic models. Hotspots preferentially occur in regions where calculated stress anomalies are tensile or slightly compressive. Results do not strongly depend on radial mantle viscosity structure, lithospheric rheology (viscous or elastic) or plate motion model. The model also predicts the directions of motion well for most plates; misfits in the predicted magnitudes can be explained qualitatively. Stress anomalies due to causes within the lithosphere (oceanic cooling with age, variations in crustal thickness, topography isostatically compensated at subcrustal levels) are also computed. Predicted stress directions in the absence of mantle flow; can explain observations almost as well as mantle flow. Nevertheless, cui-rent models of mantle flow are largely in accord with interpolations of observed principal stress directions and the observed plate motions. (C) 2001 Elsevier Science B.V. All rights reserved.
Keywords
stress fields, lithosphere, mantle, hot spots, plate tectonics, plate motions, models, dynamics, plumes
Journal
Earth and Planetary Science Letters
http://www.elsevier.com/wps/product/cws_home/503328
Publisher
Elsevier Science
P.O. Box 211
1000 AE Amsterdam
The Netherlands
(+31) 20 485 3757
(+31) 20 485 3432
nlinfo-f@elsevier.com
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