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Cheng 1984
Cheng, A.F. (1984). Escape of sulfur and oxygen from Io. Journal of Geophysical Research 89: doi: 10.1029/JA089iA06p03939. issn: 0148-0227.

Charged particle sputtering is reexamined as a mechanism for escape of sulfur and oxygen from Io. Corotating ions and energetic ions are considered, using the best available determinations of ion fluxes and sputtering yields. It is unclear whether molecular SO2 is the dominant escaping neutral from Io or whether atomic O and S are dominant, but the Voyager detection of SO2- in the cold torus implies the presence of molecular SO2 ther. Thin atmosphere models encounter serious difficulty in achieving adequate sulfur and oxygen escape rates, but they are not yet ruled out. Ionization and dissociation of SO2 in a sputter corona can dominate direct escape. In thick atmosphere models the neutral escape rates can be much higher, but the oxygen escape rate tends to be too high relative to the sulfur escape rate unless diffusive separation in the atmosphere is limited, perhaps by rapid mixing.

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Journal of Geophysical Research
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