In an effort to understand the influence of albedo and large-scale topography on remote lunar surface measurements, we investigate the relationship between measured Clementine long-wave infrared (LWIR) camera temperatures and ultraviolet-visible (UVVIS) camera 750-nm reflectances. We compare the observed temperature-reflectance relationships with those predicted using a rough-surface numerical model with varying albedo. The lunar surface response in different highland and mare locations is explored as a function of varying phase angle. At very low phase angles the temperature and reflectance response is primarily governed by the variation in single-scattering albedo regardless of the presence of topography. As the phase angle increases, the influence of surface roughness grows. Finally, at moderate to high phase angles the effect of surface roughness dominates. In the absence of large-scale topography the lunar surface temperature and reflectance response at all phase angles is governed by the variation in single-scattering albedo. LWIR-measured temperature variations yield local topographic information at high incidence angles that is unavailable via the reflectance, while UVVIS-measured reflectance variations yield local topographic information at low incidence angles that is unavailable via the temperature. ¿ 2001 American Geophysical Union